Light & Elevated Temperature Induced Degradation

LeTID

RETC stays up to date with the latest  protocols of the Light and Elevated Temperature Degradation (LeTID) testing standard. With the emergence of Passivated Emitter Rear Cell (PERC) for poly and mono-crystalline silicon cell architectures, LeTID has become a standard test procedure now included in the Thresher Test.

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LID